Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Micro Deformation Measurement Using Temporal Phase-Shifting and Spatial-Carrier Digital Speckle Pattern Interferometry


    Contributors:
    Wu, Sijin (author) / Gao, Xinya (author) / Lv, Yong (author) / Jiang, Yanpeng (author) / Fang, Yao (author) / Zhou, Aiguo (author)

    Conference:

    SAE 2016 World Congress and Exhibition



    Publication date :

    2016-01-01


    Size :

    ALL-ALL



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Phase-shifting comparative speckle pattern interferometry

    Moustafa,N. / Kornis,J. / Fuezessy,Z. et al. | Automotive engineering | 1998


    Precision Measurement of Deformation Using a Self-calibrated Digital Speckle Pattern Interferometry (DSPI)

    Yang, Lianxiang / Xu, Nan / Feng, Qibo et al. | SAE Technical Papers | 2010


    Phase-shifting speckle interferometry for complete in-plane displacement measurement

    Moore, A. J. / Tyrer, J. R. / Institute of Physics; Applied Optics Division et al. | British Library Conference Proceedings | 1990


    Double-pulsed-carrier speckle-shearing pattern interferometry for transient deformation analysis [3478-35]

    Fernandez, A. / Doval, A. F. / Davila, A. et al. | British Library Conference Proceedings | 1998