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    Title :

    A New Optical Technique for Surface Roughness Measurement of Tio~2 Thin Films


    Contributors:

    Conference:

    International conference; 2nd, Mechanical and aerospace engineering; (ICMAE) 2011) ; 2011 ; Bangkok, Thailand



    Publication date :

    2012-01-01


    Size :

    8 pages


    Remarks:

    Includes bibliographical references and index.




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English





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    Surface Roughness Measurement by Optical Pattern Projection

    Inari, T. | British Library Online Contents | 1998