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    Title :

    Total Dose, Displacement Damage and Single Event Effects in the Radiation Hardened CMOS APS HAS2 (AAS 10-022)



    Conference:

    33rd, Rocky Mountain Guidance and Control Conference ; 2010 ; Breckenridge, CO



    Publication date :

    2010-01-01


    Size :

    14 pages


    Remarks:

    Includes bibliographical references and indexes. Proceedings of the 33rd Annual AAS Rocky Mountain Guidance and Control Conference.



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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