Total Dose, Displacement Damage and Single Event Effects in the Radiation Hardened CMOS APS HAS2 (AAS 10-022)
33rd, Rocky Mountain Guidance and Control Conference ; 2010 ; Breckenridge, CO
01.01.2010
14 pages
Includes bibliographical references and indexes. Proceedings of the 33rd Annual AAS Rocky Mountain Guidance and Control Conference.
Aufsatz (Konferenz)
Englisch
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