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    Title :

    A Novel Built-In Methodology for Screening LDMOS Transistors to Achieve Zero Defects in the Automotive Environment



    Conference:

    6th, International conference on integrated power electronics systems; CIPS 2010 ; 2010 ; Nuremberg, Germany



    Publication date :

    2010-01-01


    Size :

    6 pages


    Remarks:

    Also held on CD-ROM. Held in Cage




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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    Methods to Achieve Nationwide Automotive Diagnostic Testing

    Fetterhoff, Kenneth I. / Rackliffe, Richard J. | SAE Technical Papers | 1973