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    Title :

    Automated Instrument Panel Cluster Testing using Hardware in the Loop Simulators



    Conference:

    World Congress, Society of Automotive Engineers; SAE 2008 world congress ; 2008 ; Detroit, MI



    Publication date :

    2008-01-01


    Size :

    8 pages



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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