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    Title :

    Subpixel evaluation of distorted circle characteristics [6503-16]



    Conference:

    Conference; 15th, Machine vision applications in industrial inspection ; 2007 ; San Jose, CA



    Publication date :

    2007-01-01


    Size :

    65030G


    Remarks:

    Includes bibliographical references and author index.




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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