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    Titel :

    Subpixel evaluation of distorted circle characteristics [6503-16]



    Kongress:

    Conference; 15th, Machine vision applications in industrial inspection ; 2007 ; San Jose, CA



    Erscheinungsdatum :

    01.01.2007


    Format / Umfang :

    65030G


    Anmerkungen:

    Includes bibliographical references and author index.




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Infrared imaging and machine vision [6503-08]

    Meriaudeau, F. / IS & T--the Society for Imaging Science and Technology / Society of Photo-optical Instrumentation Engineers | British Library Conference Proceedings | 2007


    Subpixel Estimation of Circle Parameters Using Orthogonal Circular Detector

    Fei-Long, C. / Shiaur-Wehn, L. | British Library Online Contents | 2000


    Setting up task-optimal illumination automatically for inspection purposes [6503-20]

    Uusitalo, J. / Tuokko, R. / IS & T--the Society for Imaging Science and Technology et al. | British Library Conference Proceedings | 2007


    High-performance surface inspection method for thin-film sensors [6503-10]

    Wieser, V. / Larndorfer, S. / Moser, B. et al. | British Library Conference Proceedings | 2007


    Camera calibrationless vision callbration for transfer robot system [6503-15]

    Kimura, N. / Moriya, T. / Matsumoto, K. et al. | British Library Conference Proceedings | 2007