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    Titel :

    Subpixel evaluation of distorted circle characteristics [6503-16]



    Kongress:

    Conference; 15th, Machine vision applications in industrial inspection ; 2007 ; San Jose, CA



    Erscheinungsdatum :

    01.01.2007


    Format / Umfang :

    65030G


    Anmerkungen:

    Includes bibliographical references and author index.




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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