Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Development of Speed-Related Ride Quality Thresholds Using International Roughness Index



    Conference:

    Annual meeting; 85th, Transportation Research Board; Pavement management: monitoring, evaluation, and data storage, and accelerated testing, 2006 ; 2006 ; Washington, DC



    Publication date :

    2006-01-01


    Size :

    7 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Development of Speed-Related Ride Quality Thresholds Using International Roughness Index

    Yu, Jianxiong / Chou, Eddie Y. J. / Yau, Jyh-Tyng | Transportation Research Record | 2006


    Development of Speed-Related Ride Quality Thresholds Using International Roughness Index

    Yu, Jianxiong / Chou, Eddie / Yau, Jyh-Tyng | Transportation Research Record | 2006




    Ride Quality Thresholds from the Motorist's Perspective

    T. H. Poister / P. M. Garvey / M. T. Pietrucha et al. | NTIS | 2003