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    Title :

    Characterization and Recovery of Deep Sub Micron (DSM) Technologies Behavior Under Radiation


    Contributors:
    Stoica, A. (author) / Wang, X. (author) / Keymeulen, D. (author) / Zebulum, R. S. (author) / Ferguson, M. I. (author) / Guo, X. (author) / IEEE

    Conference:

    IEEE aerospace conference ; 2005 ; Big Sky, MT



    Publication date :

    2005-01-01


    Size :

    9 pages


    Remarks:

    IEEE cat no 05TH8788




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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