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    Title :

    Reliability Evaluation of 1.3 Micron, Oxide-Apertured, InGaAsN VCSELs



    Conference:

    annual meeting; 17TH, IEEE Lasers & Electro-optics Society:; LEOS 2004 ; 2004 ; Rio Grande, Puerto Rico



    Publication date :

    2004-01-01


    Size :

    2 pages


    Remarks:

    IEEE cat. no. 04CH37581




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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