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    Title :

    Self-Normalized Linear Tests


    Contributors:

    Conference:

    Conference, Computer vision and pattern recognition; Proceedings of the 2004 IEEE Computer Society conference on computer vision and pattern recognition: CVPR ; 2004 ; Washington, DC



    Publication date :

    2004-01-01


    Size :

    II-616-622


    Remarks:

    Vol 2 of 2




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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