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    Title :

    MSTAR: an absolute metrology sensor with sub-micron accuracy for space-based applications


    Contributors:

    Conference:

    5th, International conference on space optics ; 2004 ; Toulouse, France



    Publication date :

    2004-01-01


    Size :

    8 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    MSTAR: a sub-micron absolute metrology system

    Lay, O. / Dubovitsky, S. / Peters, R. et al. | NTRS | 2002


    Design considerations and validation of the MSTAR absolute metrology system

    Jeganathan, Muthu / Burger, Johan P. / Dubovitsky, Serge et al. | NTRS | 2004


    Absolute distance measurement with 0.1 /spl mu/m accuracy using the MSTAR sensor

    Lay, O.P. / Dubovitsky, S. / Peters, R.D. et al. | IEEE | 2004


    High Accuracy Absolute Distance Metrology

    Swinkels, B. L. / European Space Agency / Centre Nationale d'Etudes Spatiales | British Library Conference Proceedings | 2006


    MSTAR Requirements and Reference Design

    J. E. Hanson / B. A. Jaroux | NTIS | 2014