Advanced industrial fluorescence metrology used for qualification of high-quality optical materials [5188-23]
Annual conference, Advanced characterization techniques for optics, semiconductors, and nanotechnologies
2003-01-01
8 pages
Conference paper
English
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Advanced transmission electron microscopy for nano-optics (Invited Paper) [5188-28]
British Library Conference Proceedings | 2003
|At-wavelength metrology on Sc-based multilayers for the UV and water window [5188-17]
British Library Conference Proceedings | 2003
|2011-5188 An Integrated Sublimator Driven Coldplate
British Library Conference Proceedings | 2011
|British Library Conference Proceedings | 2001
|Mueller matrix polarimeter in 157 nm [5188-18]
British Library Conference Proceedings | 2003
|