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    Titel :

    Advanced industrial fluorescence metrology used for qualification of high-quality optical materials [5188-23]



    Kongress:

    Annual conference, Advanced characterization techniques for optics, semiconductors, and nanotechnologies



    Erscheinungsdatum :

    01.01.2003


    Format / Umfang :

    8 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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    Leimkuehler, T. / Kennedy, S. / American Institute of Aeronautics and Astronautics | British Library Conference Proceedings | 2011


    Advanced transmission electron microscopy for nano-optics (Invited Paper) [5188-28]

    Kaiser, U. A. / International Society for Optical Engineering | British Library Conference Proceedings | 2003


    At-wavelength metrology on Sc-based multilayers for the UV and water window [5188-17]

    Schafers, F. / Yulin, S. A. / Feigl, T. et al. | British Library Conference Proceedings | 2003



    Mueller matrix polarimeter in 157 nm [5188-18]

    Jin, L. / Kowa, H. / Otani, Y. et al. | British Library Conference Proceedings | 2003