Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    At-wavelength metrology on Sc-based multilayers for the UV and water window [5188-17]



    Kongress:

    Annual conference, Advanced characterization techniques for optics, semiconductors, and nanotechnologies



    Erscheinungsdatum :

    01.01.2003


    Format / Umfang :

    8 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    2011-5188 An Integrated Sublimator Driven Coldplate

    Leimkuehler, T. / Kennedy, S. / American Institute of Aeronautics and Astronautics | British Library Conference Proceedings | 2011


    Advanced industrial fluorescence metrology used for qualification of high-quality optical materials [5188-23]

    Engel, A. / Becker, H.-J. / Sohr, O. et al. | British Library Conference Proceedings | 2003


    Reliable determination of wavelength dependence of thin film refractive index [5188-25]

    Tikhonravov, A. V. / Trubetskov, M. K. / Amotchkina, T. V. et al. | British Library Conference Proceedings | 2003


    Phase-shifting algorithm via wavelength tuning based on temporal Fourier transform [5188-41]

    Yu, Y. / Zhang, B. / Jiao, Y. et al. | British Library Conference Proceedings | 2003


    Mueller matrix polarimeter in 157 nm [5188-18]

    Jin, L. / Kowa, H. / Otani, Y. et al. | British Library Conference Proceedings | 2003