Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Optical constants of sputtered U and a-Si at 30.4 and 58.4 nm [3767-55]



    Conference:

    Conference, EUV, X-ray, and neutron optics and sources ; 1999 ; Denver, CO



    Publication date :

    1999-01-01


    Size :

    8 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Nr. 3767

    DataCite | 1917


    EUV spectroscopy of ultrafast capillary discharges [3767-52]

    Knight, L. V. / Turley, R. S. / Crawford, C. et al. | British Library Conference Proceedings | 1999


    High-uniformity collimator for x-ray proximity lithography [3767-06]

    Cash, W. C. / SPIE | British Library Conference Proceedings | 1999


    Microfocusing VLS-grating-based beamline for advanced microscopy [3767-38]

    Cocco, D. / Marsi, M. / Kiskinova, M. et al. | British Library Conference Proceedings | 1999


    Smoothing of mirror substrates by thin-film deposition [3767-21]

    Spiller, E. A. / Baker, S. L. / Parra, E. et al. | British Library Conference Proceedings | 1999