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    Title :

    Testing of glancing incidence mirrors using sampled profile measurements (Invited Paper) [3767-16]



    Conference:

    Conference, EUV, X-ray, and neutron optics and sources ; 1999 ; Denver, CO



    Publication date :

    1999-01-01


    Size :

    15 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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    Nr. 3767

    DataCite | 1917


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    Development of soft x-ray multilayer mirrors for a wavelength of 3 nm [3767-34]

    Sakano, K. / Yamamoto, M. / SPIE | British Library Conference Proceedings | 1999