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    Titel :

    Testing of glancing incidence mirrors using sampled profile measurements (Invited Paper) [3767-16]


    Beteiligte:

    Kongress:

    Conference, EUV, X-ray, and neutron optics and sources ; 1999 ; Denver, CO



    Erscheinungsdatum :

    1999-01-01


    Format / Umfang :

    15 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Dual-function EUV multilayer mirrors for the IMAGE mission [3767-54]

    Allred, D. D. / Turley, R. S. / Squires, M. B. et al. | British Library Conference Proceedings | 1999


    Nr. 3767

    DataCite | 1917


    Liquid-target laser-plasma sources for EUV and x-ray lithography (Invited Paper) [3767-01]

    Hertz, H. M. / Berglund, M. / Hansson, B. A. M. et al. | British Library Conference Proceedings | 1999


    New measurements with a perfect crystal cavity for neutrons [3767-48]

    Jakel, M. R. / Carlile, C. J. / Jericha, E. et al. | British Library Conference Proceedings | 1999


    Development of soft x-ray multilayer mirrors for a wavelength of 3 nm [3767-34]

    Sakano, K. / Yamamoto, M. / SPIE | British Library Conference Proceedings | 1999