Reliability of 0.98-1.02 mum InGaAs Laser Diodes ∼ Improvement by Low Temperature Growth of Active Laser ∼
Annual meeting; 12th, IEEE; Lasers and Electro-Optics Society; LEOS '99 ; 1999 ; San Francisco, CA
1999-01-01
2 pages
IEEE cat no 99CH37009
Conference paper
English
electro-optics , LEOS , IEEE , lasers
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