Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Measurement of thicknesses and refractive indices by Iow-coherence confocal interferometric microscopy



    Conference:

    International conference on optics and optoelectronics ; 1998 ; Dehradun; India



    Publication date :

    1999-01-01


    Size :

    13 pages


    Remarks:

    Also known as ICOL-98




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Common-path confocal interferometric surface plasmon microscopy

    Zhang, Bei / Yan, Peng / Wang, Le et al. | British Library Online Contents | 2017



    Imaging Interferometric Microscopy

    Kuznetsova, Y. / Neumann, A. / Brueck, S.R.J. | IEEE | 2005


    Surface profile measurement using chromatic confocal microscopy [5606-19]

    Shi, K. / Li, P. / Yin, S. et al. | British Library Conference Proceedings | 2004


    Coherence Evaluation of TanDEM-X Interferometric Data

    Martone, Michele / Bräutigam, Benjamin / Rizzoli, Paola et al. | German Aerospace Center (DLR) | 2012

    Free access