Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Boundary Scan: Moving Test Up to Higher Integration Levels



    Conference:

    Conference; 3rd, Electronic components ; 1997 ; Noordwijk; The Netherlands



    Publication date :

    1997-01-01


    Size :

    6 pages


    Remarks:

    Also known as EECC'97



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Boundary Scan: Moving Test Up to Higher Integration Levels

    Stearns, B. S. | British Library Online Contents | 1997


    Boundary Scan et test in situ s'unissent pour le test

    British Library Online Contents | 2003


    Boundary-scan technology

    Online Contents | 1995


    LASER SCAN SYSTEM, LASER SCAN METHOD, MOVING LASER SCAN SYSTEM, AND PROGRAM

    KURODA YOJI | European Patent Office | 2018

    Free access

    A Study of Boundary Scan Test Technique for Integrated PCB

    Qing, L. / Zhiqiong, X. | British Library Online Contents | 2004