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    Title :

    EBIC and TEM analysis of catastrophic optical damage in high-power GaAlAs/GaInAs lasers [3004-19]



    Conference:

    Conference, Fabrication, testing, and reliability of semiconductor lasers II ; 1997 ; San Jose; CA



    Publication date :

    1997-01-01


    Size :

    6 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Electrostatic discharge damage to pump lasers while operating (Invited Paper) [3004-12]

    Plumb, R. G. S. / Jeziorska, A. M. / SPIE | British Library Conference Proceedings | 1997


    Nr. 3004

    DataCite | 1903


    High-Power GaInAs/GaInAsP/GalnP 980-nm Pump Lasers

    IEEE; Lasers and Electro-Optics Society | British Library Conference Proceedings | 1993


    Vertical-cavity surface-emitting lasers: the applications (Invited Paper) [3004-13]

    Morgan, R. A. / Lehman, J. A. / Hibbs-Brenner, M. K. et al. | British Library Conference Proceedings | 1997