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    Title :

    Transmission electron microscopy (TEM) defect studies of molecular beam epitaxy (MBE) grown ZnS~xSe~1~-~x/GaAs interface [2228-14]



    Conference:

    Conference, Producibility of II-VI materials and devices ; 1994 ; Orlando; FL



    Publication date :

    1994-01-01


    Size :

    9 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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