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    Titel :

    Transmission electron microscopy (TEM) defect studies of molecular beam epitaxy (MBE) grown ZnS~xSe~1~-~x/GaAs interface [2228-14]



    Kongress:

    Conference, Producibility of II-VI materials and devices ; 1994 ; Orlando; FL



    Erscheinungsdatum :

    01.01.1994


    Format / Umfang :

    9 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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