Synonyme wurden verwendet für: Gewerbe
Suche ohne Synonyme: keywords:("Gewerbe")

1–50 von 1,318 Ergebnissen
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    Autohaus : wer uns liest, führt

    Zentralverband Deutsches Kraftfahrzeuggewerbe / Zentralverband des Kraftfahrzeughandels und -gewerbes | TIBKAT | 1.1957,1 -
    Schlagwörter: Kfz-Gewerbe

    Kfz-Betrieb : offizielles Organ Deutsches Kraftfahrzeuggewerbe

    Zentralverband Deutsches Kraftfahrzeuggewerbe | TIBKAT | 59.1969 - 61.1971; 71.1981 -
    Schlagwörter: Kfz-Gewerbe

    Grundlagen der Automobilwirtschaft : das Standardwerk der Automobilbranche

    Springer Fachmedien München GmbH | TIBKAT | 2016
    Schlagwörter: Kfz-Gewerbe

      Grundlagen der Automobilwirtschaft : das Standardwerk der Automobilbranche

      Springer Fachmedien München GmbH | SLUB | 2016
      Schlagwörter: Kfz-Gewerbe

    Wesen, Grundlage und Aufbau der Ehrengerichtsbarkeit der gewerblichen Wirtschaft

    Reuther, Hans I. | TIBKAT | 1937
    Schlagwörter: Gewerbe

    Eigenverbrauch im Haushalt und Integration eines E-Fahrzeuges

    Urban, Hans | Tema Archiv | 2013
    Schlagwörter: Gewerbe

    Was wäre wenn ein Extremereignis die Oberrheinregion treffen würde?

    Hill, Stefan / Meuser, Andreas | Tema Archiv | 2015
    Schlagwörter: Gewerbe

    Ethno-Marketing in der Automobilbranche : Untersuchungen zur Wirkung von Ethno-Marketing auf türkischstämmige Kunden in Deutschland

    Bethge, Gesa / Technische Universität Braunschweig / Springer Fachmedien Wiesbaden | TIBKAT | 2018
    Schlagwörter: Kfz-Gewerbe

    Citylogistik für Regensburg

    Grundl, Robert | Tema Archiv | 2011
    Schlagwörter: Gewerbe

    Die Automobilwirtschaft im Wandel - Bestandsaufnahme und Perspektiven

    Mattes, Bernhard / Meffert, Heribert / Landwehr, Rainer | TIBKAT | 2003
    Schlagwörter: Kfz-Gewerbe

    Neue Reinigungsanlage aus der CSSR

    Frais, J. | Tema Archiv | 1979
    Schlagwörter: WASCHMASCHINE (GEWERBE)

    Energy conservation Final rept.

    Van, S. / Carpenter, J. / Wiegand, M. | Tema Archiv | 1974
    Schlagwörter: GEWERBE

    Brand Community Management : eine empirische Analyse am Beispiel der Automobilbranche

    Hartleb, Vivian | TIBKAT | 2009
    Schlagwörter: Kfz-Gewerbe

    Aerospace and digitalization : a transformation through key industry 4.0 technologies

    Carou, Diego | TIBKAT | 2021
    Schlagwörter: Aerospace industries

    Lärmbelästigung in Deutschland. Ergebnisse einer repräsentativen Umfrage

    Ortscheid, J. / Wende, H. | Tema Archiv | 2002
    Schlagwörter: Gewerbe

    Deck-washing machine for ore/coal carriers

    Tema Archiv | 1981
    Schlagwörter: WASCHMASCHINE (GEWERBE)

    The Relationship between Temperature and Levitation Stiffness of YBCO Bulk for Maglev Vehicle

    Jing, H. / Jiang, M. / Wang, S.Y. | British Library Conference Proceedings | 2012
    Schlagwörter: Manufacturing industries

    AFM tip calibration using nanometer-sized structures induced by ion beam sputtering [4449-28]

    Frost, F. / Hirsch, D. / Schindler, A. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: semiconductor industries , data storage industries

    Measuring the scatter distribution of PSL spheres on Si wafers using a fast calibrated CMOS photodetector array [4449-20]

    Rinder, T. / Rothe, H. / SPIE | British Library Conference Proceedings | 2001
    Schlagwörter: semiconductor industries , data storage industries

    Polarized light scattering from metallic particles on silicon wafers [4449-39]

    Kim, J. H. / Ehrman, S. H. / Mulholland, G. W. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: semiconductor industries , data storage industries

    Measurement of the elastic constants of nanometric films [4449-16]

    Beghi, M. G. / Bottani, C. E. / Bassi, A. L. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: semiconductor industries , data storage industries

    Stitching interferometry of aspherical surfaces [4449-34]

    Hansel, T. / Nickel, A. / Schindler, A. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: semiconductor industries , data storage industries

    Rapid Confocal Sensor: a noncontact profilometer for fast 3D submicron inspection and metrology of large formats [4449-22]

    Vaughnn, D. / Watkins, C. / Anderson, D. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: semiconductor industries , data storage industries

    Interferometric metrology of wafer nanotopography for advanced CMOS process integration (Invited Paper) [4449-21]

    Valley, J. F. / Koliopoulos, C. L. / Tang, S. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: semiconductor industries , data storage industries

    Accurate sizing of deposited PSL spheres from light scatter measurements [4449-19]

    Stover, J. C. / Scheer, C. A. / SPIE | British Library Conference Proceedings | 2001
    Schlagwörter: semiconductor industries , data storage industries

    Measuring small absorption losses of laser pulses in fused silica by a pump and probe technique [4449-03]

    Muhlig, C. / Kufert, S. / Bark-Zollmann, S. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: semiconductor industries , data storage industries

    Measurement of total integrated scatter of optical coatings for 157-nm lithography [4449-04]

    Saito, T. / Saito, J. / Nakamura, E. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: semiconductor industries , data storage industries

    Feasibility and applicability of integrated metrology using spectroscopic ellipsometry in a cluster tool [4449-10]

    Boher, P. / Piel, J. P. / Stehle, J. L. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: semiconductor industries , data storage industries

    Infrared spectroscopic ellipsometry for nondestructive characterization of free-carrier and crystal-structure properties of group-III-nitride semiconductor device heterostructures [4449-08]

    Schubert, M. / Kasic, A. / Figge, S. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: semiconductor industries , data storage industries

    Measurement of absorptance of optical coatings for F~2 lithography [4449-02]

    Ouchi, C. / Hasegawa, M. / Matsumoto, A. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: semiconductor industries , data storage industries

    Numerical investigation of the resolution in solid immersion lens systems [4099-28]

    Bischoff, J. / Brunner, R. / SPIE | British Library Conference Proceedings | 2000
    Schlagwörter: semiconductor industries , data storage industries

    Present and future interference microscope systems for magnetic head metrology [4099-21]

    Caber, P. J. / Olszak, A. G. / Ragan, C. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: semiconductor industries , data storage industries

    Annual economic review of British engineering industry

    de Neuman, A.M. | Engineering Index Backfile | 1942
    Schlagwörter: Industries

    Decentralisation of industries

    Engineering Index Backfile | 1933
    Schlagwörter: Industries

    Investigations of transmittance and reflectance in the DUV/VUV spectral range [4099-36]

    Kadkhoda, P. / Blaschke, H. / Kohlhaas, J. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: semiconductor industries , data storage industries

    X-ray investigations of a near surface layer of metal samples [4099-33]

    Gilev, O. N. / Asadchikov, V. E. / Duparre, A. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: semiconductor industries , data storage industries

    Optical testing of long cylindrical lenses by means of scanning deflectometry [4099-17]

    van Amstel, W. D. / van de Goor, P. F. A. / Horijon, J. L. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: semiconductor industries , data storage industries

    Evaluating optical and supersmooth surface using AFM in optical manufacturing technology [4099-07]

    Li, J. / Xiao, S. / Li, X. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: semiconductor industries , data storage industries

    Lithography: a look at what is ahead (Invited Paper) [4099-01]

    Levinson, H. J. / SPIE | British Library Conference Proceedings | 2000
    Schlagwörter: semiconductor industries , data storage industries

    Recommendations for the metrological calibration of SPMs: a survey on the European SPMet network project (Invited Paper) [4449-27]

    Rothe, H. / Wilkening, G. / Huser, D. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: semiconductor industries , data storage industries

    Standardization of the measurement of laser-induced damage threshold and material absorption [4449-12]

    Wood, R. M. / SPIE | British Library Conference Proceedings | 2001
    Schlagwörter: semiconductor industries , data storage industries

    The concessions policy of Russia

    Schaal, K. | Engineering Index Backfile | 1928
    Schlagwörter: Industries

    Microstructure of thin films: correlation with laser damage threshold [4449-35]

    Ciosek, J. / Paszkowicz, W. / Pankowski, P. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: semiconductor industries , data storage industries

    Rapid x-ray reflectivity (XRR) characterization and process monitoring of multilayer Ta/Al~2O~3/Ta/SiO~2/Si [4449-30]

    Leng, J. / Opsal, J. L. / SPIE | British Library Conference Proceedings | 2001
    Schlagwörter: semiconductor industries , data storage industries

    Use of light scatter signals to identify particle material (Invited Paper) [4449-17]

    Stover, J. C. / Ivakhnenko, V. I. / Eremin, Y. A. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: semiconductor industries , data storage industries

    Recent developments in spectroscopic ellipsometry for in-situ applications (Invited Paper) [4449-07]

    Johs, B. D. / Hale, J. / Ianno, N. J. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: semiconductor industries , data storage industries

    How to measure sub-ppm optical homogeneity in fused silica: impact of temperature on accuracy and reproducibility [4449-14]

    Schoenfeld, D. / Kuehn, B. / Steinert, A. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: semiconductor industries , data storage industries