1–20 von 35 Ergebnissen
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    PROGRAMMABLE GLASS DISPLAY

    Freier Zugriff
    MOUROU JULIEN P / KOLLAR CRAIG A / MELLER DAVID G et al. | Europäisches Patentamt | 2020

    Calculation of power density directly from diffraction integrals

    Bahk, S.-W. / Yanovsky, V. / Mourou, G. | IEEE | 2005

    Confining collateral damage to less than 10 nm during femtosecond laser machining

    Picard, Y.N. / Yalisove, S.M. / Hsiao-hua Liu, et al. | IEEE | 2004

    Suppression of parasitic lasing in multi-pass Ti-sapphire amplifiers

    Chvykov, V. / Yanovsky, V. / Bahk, S.-W. et al. | IEEE | 2003

    Single shot wavefront measurement and correction of femtosecond terawatt lasers

    Queneuille, J. / Druon, F. / Maksimchuk, A. et al. | IEEE | 1999

    Efficient second-harmonic generation of sub-100 fs pulses from high power Nd:glass laser

    Maksimcuk, A. / Queneuille, J. / Cheriaux, G. et al. | IEEE | 1999

    Linear pre-compensation of SPM-induced pulse distortions with a deformable mirror

    Bruner, L.R. / Albert, O. / Cheriaux, G. et al. | IEEE | 1999

    Aberration correction in scanning ultrafast confocal microscopy using a deformable mirror

    Meunier, M.H. / Albert, O. / Cheriaux, G. et al. | IEEE | 1999

    Effects of wavelength and doping concentration on silicon damage threshold

    Hsiao-hua Liu, / Mourou, G. / Picard, Y.N. et al. | IEEE | 2004

    Generation, amplitude and phase characterization of 10/sup 21/ W/cm/sup 2/ intensity

    Bahk, S. / Chvykov, V. / Kalintchenko, G. et al. | IEEE | 2004

    Chirped Pulse Amplification In A Ytterbium: Glass Regenerative Amplifier

    Biswal, S. / Druon, F. / Nishimura, A. et al. | IEEE | 1997

    Relativistic electron acceleration in the wavelength-cubed regime

    Mordovanaki, A.G. / Nelson, N. / Hou, B. et al. | IEEE | 2004

    Directly diode-pumped millijoule subpicosecond Yb:glass regenerative amplifier

    Hsiao-Hua Liu, / Biswal, S. / Paye, J. et al. | IEEE | 1999

    SEM and SPM studies of single-shot damage on silicon

    Hsiao-hua Liu, / Mourou, G. / McDonald, J.P. et al. | IEEE | 2005