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Halbleiterbauelement
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The easy way to get aerospace quality semiconductors
A lightweight 8-14 micrometer thermal imager
Reliability engineering-an integrated approach at Daimler Chrysler
Definition of driver information instrumentation feature
In situ Defect-screening of Integrated LDMOS for Critical Automotive Applications
Semiconductors in high temperature applications - a future trend in automotive industry
Failure analyses of spacecraft electronics and mechanisms
Preparing for Increased Electrostatic Discharge Device Sensitivity
Microelectronics for space applications - challenges and opportunities
New techniques for predicting solar proton fluences for radiation effects applications
A R-evolution in power electronics: from "intelligent" to "super smart power" in automotive
Reliability aspects of semiconductor devices in high temperature applications
The VMOS power device - A direct interface between microprocessors
Strain depending reliability of automotive diodes
Power semiconductor devices - development trends and system interactions
New on-chip screening of gate oxides smart power devices for automotive applications