After improvement of the associated assembly system, the remaining automotive diode failures, at a level of over 4% in operation, were attributed to the internal strain based on RVT (rapid variation of temperature) test results. The X-ray diffraction spectra, or rocking curves, indicated the internal strain induced by the grinding and diffusion processes. New conditions for the diffusion process, which reduce the induced strain on the B-Al diffused side, were established. An important improvement in automotive diode reliability was obtained, with the failure percentages diminishing by a factor of between 4 and 8 in both operation and RVT tests.
Strain depending reliability of automotive diodes
1998
4 Seiten, 3 Quellen
Aufsatz (Konferenz)
Englisch
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