After improvement of the associated assembly system, the remaining automotive diode failures, at a level of over 4% in operation, were attributed to the internal strain based on RVT (rapid variation of temperature) test results. The X-ray diffraction spectra, or rocking curves, indicated the internal strain induced by the grinding and diffusion processes. New conditions for the diffusion process, which reduce the induced strain on the B-Al diffused side, were established. An important improvement in automotive diode reliability was obtained, with the failure percentages diminishing by a factor of between 4 and 8 in both operation and RVT tests.


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    Titel :

    Strain depending reliability of automotive diodes


    Beteiligte:
    Galateanu, L. (Autor:in) / Stoica, M.G. (Autor:in) / Popa, E. (Autor:in)


    Erscheinungsdatum :

    1998


    Format / Umfang :

    4 Seiten, 3 Quellen




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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