1–50 von 52 Ergebnissen
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    State of charge estimation for electric vehicle batteries using unscented kalman filtering

    He, Wei / Williard, Nicholas / Chen, Chaochao et al. | Tema Archiv | 2013

    A return on investment analysis of applying health monitoring to LED lighting systems

    Chang, Moon-Hwan / Sandborn, Peter / Pecht, Michael et al. | Tema Archiv | 2015

    Fast power cycling protocols implemented in an automated test bench dedicated to IGBT module ageing

    Forest, Francois / Rashed, Amgad / Huselstein, Jean-Jacques et al. | Tema Archiv | 2015

    Effects of different test profiles of temperature cycling tests on the reliability of RFID tags

    Lahokallio, Sanna / Saarinen-Pulli, Kirsi / Frisk, Laura | Tema Archiv | 2015

    Lifetime modeling and simulation of power modules for hybrid electrical/electrical vehicles

    Thoben, M. / Sauerland, F. / Mainka, K. et al. | Tema Archiv | 2014

    Tin whisker analysis of an automotive engine control unit

    George, Elviz / Pecht, Michael | Tema Archiv | 2014

    Multi-physics reliability simulation for solid state lighting drivers

    Tarashioon, S. / van Driel, W.D. / Zhang, G.Q. | Tema Archiv | 2014

    Methodology of reliability enhancement for high power LED driver

    Lan, Song / Tan, Cher-Ming / Wu, Kevin | Tema Archiv | 2014

    UV LEDs reliability tests for fluoro-sensing sensor application

    Arques-Orobon, F.J. / Nunez, N. / Vazquez, M. et al. | Tema Archiv | 2014

    How supercapacitors reach end of life criteria during calendar life and power cycling tests

    Chaari, R. / Briat, O. / Deletage, J.Y. et al. | Tema Archiv | 2011

    Analysis of ultracapacitors ageing in automotive application

    Catelani, M. / Ciani, L. / Marracci, M. et al. | Tema Archiv | 2013

    Optimization of wire connections design for power electronics

    Celnikier, Y. / Dupont, L. / Herve, E. et al. | Tema Archiv | 2011

    Life cycle cost impact of using prognostic health management (PHM) for helicopter avionics

    Scanff, E. / Feldman, K.L. / Ghelam, S. et al. | Tema Archiv | 2007

    Wafer-level LED-SiP based mobile flash module and characterization

    Lin, Jyh-Rong / Ng, Tuen-Yi / Wang, Zhaoxin et al. | Tema Archiv | 2012

    Electrical steering of vehicles - fault-tolerant analysis and design

    Blanke, M. / Thomsen, J.S. | Tema Archiv | 2006

    A complete methodology for assessing GaN behaviour for military applications

    Moreau, C. / Le Pipec, M. / Tence, S. et al. | Tema Archiv | 2010

    Sequential environmental stresses tests qualification for automotive components

    Bahi, M.A. / Lecuyer, P. / Fremont, H. et al. | Tema Archiv | 2007

    Reliability potential of epoxy based encapsulants for automotive applications

    Braun, T. / Becker, K.F. / Koch, M. et al. | Tema Archiv | 2005

    Technologies and reliability of modern embedded flash cells

    Sikora, A. / Pesl, F.P. / Unger, W. et al. | Tema Archiv | 2006

    Failure mechanisms and qualification testing of passive components

    Post, H.A. / Letullier, P. / Briolat, T. et al. | Tema Archiv | 2005

    Part average analysis - A tool for reducing failure rates in automotive electronics

    Wagner, M. / Unger, W. / Wondrak, W. | Tema Archiv | 2006

    Semiconductors in high temperature applications - a future trend in automotive industry

    Goroll, M. / Pufall, R. / Kanert, W. et al. | Tema Archiv | 2004

    Reliability aspects of semiconductor devices in high temperature applications

    Kanert, W. / Dettmer, H. / Plikat, B. et al. | Tema Archiv | 2003

    High temperature reliability testing of aluminum and tantalum electrolytic capacitors

    Dehbi, A. / Wondrak, W. / Ousten, Y. et al. | Tema Archiv | 2002

    Reliability of MEMS - a methodical approach

    Muller-Fiedler, R. / Wagner, U. / Bernhard, W. | Tema Archiv | 2002

    Reliable power electronics for automotive applications

    Seliger, N. / Wolfgang, E. / Lefranc, G. et al. | Tema Archiv | 2002

    An assessment of the value of added screening of electronic components for commercial aerospace applications

    Hester, K.D. / Koehler, M.P. / Kanciak-Chwialkowski, H. et al. | Tema Archiv | 2001

    Ball grid array reliability assessment for aerospace applications

    Ghaffarian, R. / Kim, N.P. | Tema Archiv | 1999

    Long term reliability testing of HV-IGBT modules in worst case traction operation

    Fratelli, L. / Cascone, B. / Giannini, G. et al. | Tema Archiv | 1999

    On-chip reliability investigations on power modules actually working in inverter systems

    Franke, T. / Honsberg-Riedl, M. / Simon, P. et al. | Tema Archiv | 1998

    Strain depending reliability of automotive diodes

    Galateanu, L. / Stoica, M.G. / Popa, E. | Tema Archiv | 1998