This paper is introducing a multi-physics reliability simulation approach for solid state lighting (SSL) electronic drivers. This work explores the system-level degradation of SSL drivers by means of applying its components reliability information into a system level simulation. Reliability information of the components such as capacitor, and inductor, defines how a component electrical behavior changes with temperature, and also with time. The purpose of this simulation is to understand the thermal–electrical behavior of SSL electronic drivers through their lifetime. Once the behavior of the device during its lifetime is understood, the real cause of the failure can be distinguished and possibly solved.


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    Titel :

    Multi-physics reliability simulation for solid state lighting drivers


    Beteiligte:
    Tarashioon, S. (Autor:in) / van Driel, W.D. (Autor:in) / Zhang, G.Q. (Autor:in)

    Erschienen in:

    Microelectronics Reliability ; 54 , 6-7 ; 1212-1222


    Erscheinungsdatum :

    2014


    Format / Umfang :

    11 Seiten, 43 Quellen




    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Print


    Sprache :

    Englisch





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