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Halbleitertechnologie
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keywords:(Halbleitertechnologie)
Determination of recombination cross section for free electron in n-CuInS~2 [3179-53]
Influence of gamma radiation on performance of Nd^3^+-doped SrLaGa~3O~7? lasers [3179-48]
Photoluminescence of GaAs grown by liquid phase epitaxy from Bi solution [3179-21]
Preparation, morphology, and electrical properties of TiN~1~-~xC~x thin layers [3179-17]
Activated lithium tetraborate and calcium sulphate in radiation dosimetry [3179-46]
Time-resolved spectroscopy of low-dimensional structures based on porous silicon [3179-07]
Determination of trap depth by analysis of the thermoluminescence peak shape [3179-55]
Simple methods for the analysis of TL glow curves [3179-51]
Kinetics of luminescence due to spatial correlation of traps [3179-50]
Infrared thermal detectors versus photon detectors: II. focal plane arrays (Invited Paper) [3179-40]
Influence of internal structure on electrical properties of 1,4-cis polybutadiene films [3179-35]
Lithographic properties of perylenetetracarboxylic acid derivative films [3179-18]
PtSi Schottky-barrier infrared FPAs with CDS readout (Invited Paper) [3179-39]
Laser scanning tomograph as the tool for investigation of semiconductor materials [3179-30]