This document establishes methods for characterizing the robustness of vehicle electronic modules to certain environmental stresses. They include: Voltage-Temperature Design Margins Voltage Interruptions-Transients Over Temperature Voltage Dips Current Draw Under a Number of Conditions These methods can be applied during Development, Pre-Qualification, Qualification or for Conformity. This document does not address other environmental robustness stresses such as vibration, high temp exposure, load faults, ESD, etc. The methods in this document, using relatively simple and low cost techniques, are designed to address some of the deficiencies inherent in other commonly used testing methods for conducted immunity. Examples of such deficiencies - not tested throughout temperature range and use of idealized signals that do not adequately represent the real world. It also addresses other robustness issues not addressed elsewhere.
Characterization, Conducted Immunity
29.04.2005
Aufsatz (Konferenz)
Englisch
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