The methods included in this document are: a Voltage-Temperature Design Margins. b Voltage Interruptions and Transients. c Voltage Dropouts and Dips. d Current Draw Under a Number of Conditions. e Switch Input Noise These methods are best applied during the Development stage but can be used at all stages (e.g., Pre-Qualification, Qualification or Conformity). This revision includes corrections, clarifications and simplifications from July 2007 version, deletion of some tests (transient B1, B2) and addition of transient A2-a and reference to new version of SAE J1211.
Characterization, Conducted Immunity
16.07.2013
Aufsatz (Konferenz)
Englisch
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