The methods included in this document are: a Voltage-Temperature Design Margins. b Voltage Interruptions and Transients. c Voltage Dropouts and Dips. d Current Draw Under a Number of Conditions. e Switch Input Noise These methods are best applied during the Development stage but can be used at all stages (e.g. Pre-Qualification, Qualification or Conformity). Along with corrections and clarifications, this version of the document contains a completely revised section on voltage dropouts and dips which has a more proven track record of success. It also contains a new section on switch input noise.


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    Titel :

    Characterization, Conducted Immunity


    Erscheinungsdatum :

    2007-07-19



    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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