The methods included in this document are: a Voltage-Temperature Design Margins. b Voltage Interruptions and Transients. c Voltage Dropouts and Dips. d Current Draw Under a Number of Conditions. e Switch Input Noise These methods are best applied during the Development stage but can be used at all stages (e.g. Pre-Qualification, Qualification or Conformity). Along with corrections and clarifications, this version of the document contains a completely revised section on voltage dropouts and dips which has a more proven track record of success. It also contains a new section on switch input noise.
Characterization, Conducted Immunity
2007-07-19
Aufsatz (Konferenz)
Englisch
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