An integrated pressure sensor is presented which uses a custom digital signal processor and non-volatile memory to calibrate and temperature compensate a family of pressure sensor elements for a wide range of automotive applications. Unlike previously introduced analog solutions, this programmable signal conditioning engine operates in the digital domain utilizing a calibration algorithm that accounts for higher order effects beyond the realm of most analog signal conditioning approaches, and provides enhanced features that typically were implemented off-chip (or not at all) with traditional analog signal conditioning solutions that use laser or electronic trimming. A specially developed digital communication interface permits calibration of the individual sensor module via connector pins after the module has been fully assembled and encapsulated. Post-trim processing is eliminated, and calibration and module customization can be performed as an integral part of end-of-line testing at the completion of the manufacturing flow. The integrated circuit contains a pressure sensor element that is co-processed in a sub-micron mixed signal CMOS wafer fabrication process, and which can be scaled to a variety of automotive pressure sensing applications. Both digital and analog sensor outputs are available.


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    Titel :

    Programmable CMOS Integrated Pressure Sensor


    Weitere Titelangaben:

    Sae Technical Papers


    Beteiligte:
    Roeckner, B. (Autor:in) / Schuster, J. P. (Autor:in) / Czarnocki, W. (Autor:in) / Ding, X. (Autor:in)

    Kongress:

    International Congress & Exposition ; 1999



    Erscheinungsdatum :

    01.03.1999




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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