Heavy secondary ions do not significantly alter device responses. Conclusion that external reaction products cause no significant alteration of single-event-upset response based on comparison of data obtained from both lidded and unlidded devices and for proton beams impinging at angles ranging from 0 degrees to 180 degrees with respect to chip face. Study also found single-event-upset cross section increases only modestly as proton energy increased to 590 MeV, characteristic of maximum energies expected in belts of trapped protons surrounding Earth and Jupiter.
Single-Event Upsets Caused by High-Energy Protons
NASA Tech Briefs ; 10 , 1
1986-06-01
Sonstige
Keine Angabe
Englisch
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|Anomalies due to Single Event Upsets
Online Contents | 1994
|