Heavy secondary ions do not significantly alter device responses. Conclusion that external reaction products cause no significant alteration of single-event-upset response based on comparison of data obtained from both lidded and unlidded devices and for proton beams impinging at angles ranging from 0 degrees to 180 degrees with respect to chip face. Study also found single-event-upset cross section increases only modestly as proton energy increased to 590 MeV, characteristic of maximum energies expected in belts of trapped protons surrounding Earth and Jupiter.


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    Titel :

    Single-Event Upsets Caused by High-Energy Protons


    Beteiligte:
    Price, W. E. (Autor:in) / Nichols, D. K. (Autor:in) / Smith, L. S. (Autor:in) / Soli, G. A. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    1986-06-01



    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch


    Schlagwörter :


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