Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include optoelectronics, digital, analog, and bipolar devices.


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    Titel :

    Compendium of Radiation Effects Test Results from NASA Goddard Space Flight Center


    Beteiligte:
    A. D. Topper (Autor:in) / M. C. Casey (Autor:in) / E. P. Wilcox (Autor:in) / M. J. Campola (Autor:in) / D. J. Cochran (Autor:in) / M. V. O'Bryan (Autor:in) / J. A. Pellish (Autor:in) / P. J. Majewicz (Autor:in)

    Erscheinungsdatum :

    2022


    Format / Umfang :

    6 pages


    Medientyp :

    Report


    Format :

    Keine Angabe


    Sprache :

    Englisch




    Compendium of Radiation Effects Test Results from NASA Goddard Space Flight Center

    A. D. Topper / M. C. Casey / E. P. Wilcox et al. | NTIS | 2021


    Compendium of Single Event Effect Results from NASA Goddard Space Flight Center

    O'Bryan, Martha V. / LaBel, Kenneth A. / Szabo, Carl M. et al. | NTRS | 2016


    Compendium of Single Event Effect Results from NASA Goddard Space Flight Center

    M. V. Obryan / K. A. Label / J. A. Pellish et al. | NTIS | 2016


    NASA Goddard Space Flight Center

    Carter, David / Wetzel, Scott | NTRS | 2000


    NASA Goddard Space Flight Center

    Berbert, J. H. / Brownd, J. / Felsentreger, T. L. et al. | NTRS | 1977