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    High Reliability Screening of Semiconductor and Integrated Circuit Devices

    J. Lombardi / L. Mc Donough / H. Padden | NTIS | 1967


    High reliability screening of semiconductor and integrated circuit devices

    Lombardi, J. / McDonough, L. / Padden, H. | TIBKAT | 1967



    Integrated circuit sequence generator Final engineering report

    Clark, F. D. / Thomas, W. D. | NTRS | 1964