We have demonstrated the use of fluorescence confocal microscopy in mapping the Cr/sup +3/ profile within the YAG crystal fiber. A sensitivity of 2.3/spl times/10/sup 16//cm/sup 3/ was achieved, which is ten-fold of magnitude better than that of electron probe micro -analysis.


    Zugriff

    Zugriff prüfen

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    The use of fluorescence confocal microscopy in mapping Cr/sup +3/ profile within the YAG crystal fiber


    Beteiligte:
    Jian-Cheng Chen, (Autor:in) / Chia-Yao Lo, (Autor:in) / Sheng-Long Huang, (Autor:in) / Fu-Jen Kao, (Autor:in)


    Erscheinungsdatum :

    2003-01-01


    Format / Umfang :

    76839 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



    The use of fluorescence confocal microscopy in mapping Cr^+^3 profile within the YAG crystal fiber

    Chen, J.-C. / Lo, C.-Y. / Huang, S.-L. et al. | British Library Conference Proceedings | 2003


    Mapping of Cr ion profile in Cr:YAG crystal fiber by confocal microscopy

    Chen, J.C. / Lo, C.Y. / Huang, S.L. | IEEE | 2003



    Confocal microscopy using optical fiber imaging bundles

    Juskaitis, Rimas / Wilson, Tony / Watson, T. F. | SPIE | 1996


    Surface profile measurement using chromatic confocal microscopy [5606-19]

    Shi, K. / Li, P. / Yin, S. et al. | British Library Conference Proceedings | 2004