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    Titel :

    Surface profile measurement using chromatic confocal microscopy [5606-19]



    Kongress:

    Conference; 2nd, Two- and three-dimensional vision systems for inspection, control, and metrology II / edited by Kevin G. Harding ; 2004 ; Philadelphia, PA



    Erscheinungsdatum :

    2004-01-01


    Format / Umfang :

    8 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Camera sensitivity study [5606-08]

    Schlueter, J. / Murphey, Y. L. / Miller, J. W. V. et al. | British Library Conference Proceedings | 2004


    Depth determination using thermal imaging [5606-13]

    Cantello, C. / Society of Photo-optical Instrumentation Engineers | British Library Conference Proceedings | 2004


    Machine vision method for small feature measurements [5606-22]

    Harding, K. G. / Tang, S.-G. G. / Society of Photo-optical Instrumentation Engineers | British Library Conference Proceedings | 2004


    Background removal for check processing using morphology [5606-04]

    Ding, Y. / Kimura, F. / Okada, M. et al. | British Library Conference Proceedings | 2004


    Auto-calibration: new method and comparisons [5606-26]

    Wu, Y. / Shen, J. / Dai, M. et al. | British Library Conference Proceedings | 2004