Memristor devices have been identified as potential replacements for a variety of memory applications and may also be suitable for space applications. In this work, we present a review of radiation testing on TiO2-based memristor devices. The experimental results from three previous studies are reviewed and coupled here with modeling to gain a more complete understanding of the energy deposition and resulting effects on the electrical performance of the device. In addition, we discuss the implications of having a nanometer scaled thin film device and how that affects the energy deposition from the various radiation sources.


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    Titel :

    Radiation effects studies on thin film TiO2 memristor devices


    Beteiligte:
    DeIonno, Erica (Autor:in) / Looper, Mark D. (Autor:in) / Osborn, Jon V. (Autor:in) / Barnaby, Hugh J. (Autor:in) / Tong, William M. (Autor:in)


    Erscheinungsdatum :

    01.03.2013


    Format / Umfang :

    498885 byte





    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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