Memristor devices have been identified as potential replacements for a variety of memory applications and may also be suitable for space applications. In this work, we present a review of radiation testing on TiO2-based memristor devices. The experimental results from three previous studies are reviewed and coupled here with modeling to gain a more complete understanding of the energy deposition and resulting effects on the electrical performance of the device. In addition, we discuss the implications of having a nanometer scaled thin film device and how that affects the energy deposition from the various radiation sources.
Radiation effects studies on thin film TiO2 memristor devices
01.03.2013
498885 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
IEEE | 2011
|Online Contents | 2004
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