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    Titel :

    Single Event Effects and Total Dose Testing of the Intersil ISL70003SEH Integrated Point of Load Converter



    Kongress:

    10th, European Space Power Conference ; 2014 ; Noordwijkerhout, Netherlands



    Erscheinungsdatum :

    2014-01-01


    Format / Umfang :

    29 pages


    Anmerkungen:

    Held in e-store (RMS); Held on CD-ROM




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch


    Schlagwörter :


    A/D-Wandler: Intersil ubernimmt Kenet

    British Library Online Contents | 2008


    Total dose and single event effects irradiation of various commercial integrated circuits in logic families and line interfaces

    Malou, F. / Bezerra, F. / Salvaterra, G. et al. | British Library Conference Proceedings | 2002


    Integrated Power MOSFET Devices for Space Applications: The ISL70001SRH Point of Load Converter

    van Vonno, N.W. / Pearce, L.W. / Satterfield, H.W. et al. | British Library Conference Proceedings | 2011


    Total Dose, Displacement Damage and Single Event Effects in the Radiation Hardened CMOS APS HAS2 (AAS 10-022)

    Van Aken, D. / Herve, D. / Beaumel, M. et al. | British Library Conference Proceedings | 2010


    Single Event Effects Testing For Low Earth Orbit Missions with Neutrons

    B. Reddell / P. O'Neill / C. Bailey et al. | NTIS | 2015