Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Total dose and single event effects irradiation of various commercial integrated circuits in logic families and line interfaces


    Beteiligte:
    Malou, F. (Autor:in) / Bezerra, F. (Autor:in) / Salvaterra, G. (Autor:in) / Chatry, C. (Autor:in) / Falo, W. (Autor:in) / David, J.-P. (Autor:in) / Duzellier, S. (Autor:in) / European Space Agency

    Kongress:

    European space components conference ; 2002 ; Toulouse, France



    Erscheinungsdatum :

    2002-01-01


    Format / Umfang :

    6 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Total Dose Behaviour of Pure Commercial Non-Traceable Integrated Circuits

    Gutierrez, F. / Fernandez, G. / Ramos, O. et al. | British Library Conference Proceedings | 2000


    Single Event Effects and Total Dose Testing of the Intersil ISL70003SEH Integrated Point of Load Converter

    van Vonno, N.W. / White, J.D. / Pearce, L.G. et al. | British Library Conference Proceedings | 2014


    Single Event Latchup Protection of Integrated Circuits

    Layton, P. / Marshall, J. / Czajkowski, D. et al. | British Library Online Contents | 1997


    Single Event Latchup Protection of Integrated Circuits

    Layton, P. / Marshall, J. / Czajkowski, D. et al. | British Library Conference Proceedings | 1997


    Hardening analog and power management integrated circuits against single-event effects

    Van Vonno, N. W. / European Space Agency | British Library Conference Proceedings | 2002