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    Titel :

    Reliability of oxide confined 850 nm VCSELs for high speed interconnection systems


    Beteiligte:

    Kongress:

    5th, Pacific Rim conference on lasers and electro-optics; photonics lights innovation: from nano-structures and devices to systems and networks ; 2003 ; Taipei, Taiwan



    Erscheinungsdatum :

    01.01.2003


    Format / Umfang :

    162 pages


    Anmerkungen:

    Includes bibliographic references and author index



    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch





    Fabrication and Characteristics of High-Speed Oxide-Confined VCSELs Using InGaAsP-InGaP Strain-Compensated MQWs

    Chang, Y.-H. / Kuo, H. C. / Lai, F.-I. et al. | British Library Online Contents | 2004


    Fabrication issues of oxide-confined VCSELs [3003-11]

    Geib, K. M. / Choquette, K. D. / Hou, H. Q. et al. | British Library Conference Proceedings | 1997


    1.3 micron InGaAsN oxide-confined VCSELs grown by MOCVD

    Murray, C.S. / Newman, F.D. / Shangzhu Sun, et al. | IEEE | 2002


    Cavity structures for low-loss oxide-confined VCSELs [3003-27]

    Choquette, K. D. / Hadley, G. R. / Chow, W. W. et al. | British Library Conference Proceedings | 1997