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    Titel :

    Development of EUV point diffraction interferometry using the NewSUBARU undulator radiation [4782-27]



    Kongress:

    conference, X-ray mirrors crystals and multilayers ; 2002 ; Seattle, WA



    Erscheinungsdatum :

    2002-01-01


    Format / Umfang :

    8 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Nr. 4782

    DataCite | 1937


    Applications of x-ray intensity interferometry [4782-16]

    Yabashi, M. / Tamasaku, K. / Ishikawa, T. et al. | British Library Conference Proceedings | 2002


    3D surface profile measurements of large x-ray synchrotron radiation mirrors using stitching interferometry [4782-03]

    Assoufid, L. / Bray, M. / Qian, J. et al. | British Library Conference Proceedings | 2002


    High-resolution carbon/carbon multilayers [4782-22]

    Baranov, A. M. / Dietsch, R. / Holz, T. et al. | British Library Conference Proceedings | 2002


    Topography measurement of nanometer synchrotron optics [4782-02]

    Illemann, J. / Geckeler, R. D. / Weingartner, I. et al. | British Library Conference Proceedings | 2002