Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Analysis of Facet Degradation of High Power 830nm Laser Diodes



    Kongress:

    Annual meeting; 9th, IEEE: Lasers and Electro-Optics Society; LEOS '96 ; 1996 ; Boston; MA



    Erscheinungsdatum :

    01.01.1996


    Format / Umfang :

    2 pages


    Anmerkungen:

    Described as proceedings. IEEE cat no: 96CH35895



    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch





    Highly Efficient Selectively Oxidized GaAs (lambda-830nm) Vertical-Cavity Lasers

    IEEE; Lasers and Electro-Optics Society | British Library Conference Proceedings | 1996


    Modeling of facet heating in high-power laser diodes [3889-09]

    Romero, B. / Batko, G. / Arias, J. et al. | British Library Conference Proceedings | 2000


    High brightness curved-facet laser diodes operating at 980 nm

    Braddell, J. / O'Brien, P. / McInerney, J. | IEEE | 1996


    High Brightness Curved-Facet Laser Diodes Operating at 980 nm

    IEEE; Lasers and Electro-Optics Society | British Library Conference Proceedings | 1996