1–20 of 37 hits
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    Ultrahigh peak power lasers present and future

    Mourou, G. / Optical Society of America | British Library Conference Proceedings | 1997

    The physics and limits of femtosecond laser micromachining

    Ke, K. / Joglekar, A.P. / Hsiao-hua Liu, et al. | IEEE | 2005

    Temporal characterization of a self-modulated laser wakefield accelerator

    Le Blanc, S.P. / Downer, M.C. / Wagner, R. et al. | IEEE | 1997

    Suppression of parasitic lasing in multi-pass Ti-sapphire amplifiers

    Chvykov, V. / Yanovsky, V. / Bahk, S.-W. et al. | IEEE | 2003

    Spatiotemporal contrast of high-field laser

    Yanovsky, V. / Chvykov, V. / Reed, S. et al. | IEEE | 2005

    Single shot wavefront measurement and correction of femtosecond terawatt lasers

    Queneuille, J. / Druon, F. / Maksimchuk, A. et al. | IEEE | 1999

    SEM and SPM studies of single-shot damage on silicon

    Hsiao-hua Liu, / Mourou, G. / McDonald, J.P. et al. | IEEE | 2005

    Relativistic electron acceleration in the wavelength-cubed regime

    Mordovanaki, A.G. / Nelson, N. / Hou, B. et al. | IEEE | 2004

    Pulsewidth dependence of laser damage in fused silica

    An-Chun Tien, / Backus, S. / Kapteyn, H. et al. | IEEE | 1999

    Linear pre-compensation of SPM-induced pulse distortions with a deformable mirror

    Bruner, L.R. / Albert, O. / Cheriaux, G. et al. | IEEE | 1999

    Hard x-ray emission from intense femtosecond laser-solid target interactions [5196-38]

    Chen, L. M. / Forget, P. / Toth, R. et al. | British Library Conference Proceedings | 2004

    Generation of High Power Ultrashort Pulses in Erbium Oscillator Power Amplifier Systems

    Stock, M. L. / Galvanauskas, A. / Fermann, M. E. et al. | British Library Conference Proceedings | 1994

    Generation, amplitude and phase characterization of 10/sup 21/ W/cm/sup 2/ intensity

    Bahk, S. / Chvykov, V. / Kalintchenko, G. et al. | IEEE | 2004

    Fiber laser driven EUV generation

    Yu-Chung Chang, / Mordovanakis, A. / Kai-Chung Hou, et al. | IEEE | 2005