1–8 of 8 hits
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    Confining collateral damage to less than 10 nm during femtosecond laser machining

    Picard, Y.N. / Yalisove, S.M. / Hsiao-hua Liu, et al. | IEEE | 2004

    Effects of wavelength and doping concentration on silicon damage threshold

    Hsiao-hua Liu, / Mourou, G. / Picard, Y.N. et al. | IEEE | 2004

    SEM and SPM studies of single-shot damage on silicon

    Hsiao-hua Liu, / Mourou, G. / McDonald, J.P. et al. | IEEE | 2005

    Directly diode-pumped millijoule subpicosecond Yb:glass regenerative amplifier

    Hsiao-Hua Liu, / Biswal, S. / Paye, J. et al. | IEEE | 1999

    The physics and limits of femtosecond laser micromachining

    Ke, K. / Joglekar, A.P. / Hsiao-hua Liu, et al. | IEEE | 2005

    All-solid-state, directly diode-pumped chirped-pulse amplification laser system

    Braun, A. / Hsiao-Hua Liu, / Horvath, C. et al. | IEEE | 1997

    Intrastromal corneal surgery with femtosecond laser pulses

    Xinbing Liu, / Kurtz, R.M. / Braun, A. et al. | IEEE | 1997