1–20 of 41 hits
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    The Extreme Light Infrastructure: Optics' Next Horizon

    Mourou, G. / Tajima, T. | British Library Online Contents | 2011

    Calculation of power density directly from diffraction integrals

    Bahk, S.-W. / Yanovsky, V. / Mourou, G. | IEEE | 2005

    SEM and SPM studies of single-shot damage on silicon

    Hsiao-hua Liu, / Mourou, G. / McDonald, J.P. et al. | IEEE | 2005

    Beams homogenization and shaping to pump Petawatt class Ti:sapphire crystals

    Canova, F. / Chambaret, J.-P. / Mourou, G. et al. | IEEE | 2005

    Spatiotemporal contrast of high-field laser

    Yanovsky, V. / Chvykov, V. / Reed, S. et al. | IEEE | 2005

    The physics and limits of femtosecond laser micromachining

    Ke, K. / Joglekar, A.P. / Hsiao-hua Liu, et al. | IEEE | 2005

    Fiber laser driven EUV generation

    Yu-Chung Chang, / Mordovanakis, A. / Kai-Chung Hou, et al. | IEEE | 2005

    Chirped-pulse cascaded quadratic compression of millijoule-energy, 35-fs pulses

    Moses, J.A. / Wise, F.W. / Vuong, L. et al. | IEEE | 2005

    Confining collateral damage to less than 10 nm during femtosecond laser machining

    Picard, Y.N. / Yalisove, S.M. / Hsiao-hua Liu, et al. | IEEE | 2004

    Effects of wavelength and doping concentration on silicon damage threshold

    Hsiao-hua Liu, / Mourou, G. / Picard, Y.N. et al. | IEEE | 2004

    Generation, amplitude and phase characterization of 10/sup 21/ W/cm/sup 2/ intensity

    Bahk, S. / Chvykov, V. / Kalintchenko, G. et al. | IEEE | 2004

    Relativistic electron acceleration in the wavelength-cubed regime

    Mordovanaki, A.G. / Nelson, N. / Hou, B. et al. | IEEE | 2004

    Efficient generation of isolated attosecond pulses through relativistic effects

    Power, E. / Naumova, N. / Nees, J. et al. | IEEE | 2004

    Suppression of parasitic lasing in multi-pass Ti-sapphire amplifiers

    Chvykov, V. / Yanovsky, V. / Bahk, S.-W. et al. | IEEE | 2003

    Development of Petawatt scale Ti:sapphire laser at 0.05 Hz repetition rate

    Yanovsky, V. / Chvykov, V. / Bahk, S.-W. et al. | IEEE | 2003